Big Problems with Small Ions


The issue of ion contamination in electronics manufacturing processes is of critical importance. Therefore it is incumbent on manufacturers to be vigilant in detecting and minimizing ionic contamination.

By Howard Siegerman, Ph.D

Big Problems with Small Ions

THE ISSUE OF ION CONTAMINATION in microelectronics is of critical importance because electronic device failures have been directly linked to the presence of trace levels of ions. Because wipers are so widely used in the cleaning and maintenance of cleanrooms and production and test equipment, it is incumbent on the wiper manufacturer to provide products with the absolute minimum levels of detectable ions.

DETECTING & MINIMIZING IONS

This whitepaper provides details about:

  • Ions vs. Particles (Size and Scope)
  • Mobile Ion Contaminants
  • Ion Effects of Alkali Metals, Alkaline Earth Metals, and Transition Metals
  • Ion Chromatography (IC)
  • Inductively Coupled Plasma Mass Spectrometry (ICPMS)
  • Analyzing Ions in Wipers

 

Big_Problems_Small Ions_Berkshire.pdf

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